Fourth International Conference
on Sensors and Electronic Instrumentation Advances
(SEIA' 2018)




19-21 September 2018
Amsterdam, The Netherlands



About This Event





AMSTERDAM, THE NETHERLANDS





Sensors and Sensing Technology

  • Accelerometers
  • Inclinometers
  • Gyroscopes
  • Mechanical Sensors
  • Optical Sensors
  • Optical Fiber Sensors
  • Photonic Sensors
  • Chemical Sensors
  • Biosensors
  • Immunosensors
  • BioMEMS
  • Temperature Sensors
  • Pressure Sensors
  • Acoustic Sensors
  • Electromagnetic Sensors
  • Gas Sensors
  • Humidity Sensors
  • Infrared Sensors, Devices and Thermography
  • Radiation Sensors
  • Multi Sensor Fusion
  • Smart Sensors
  • Intelligent Sensors
  • Virtual Sensors
  • Sensor Interfacing and Signal Conditioning
  • Sensor Calibration
  • Nanomaterials and Electronics Technology for Sensors
  • Semiconductor Materials for Sensors
  • Polymer Materials for Sensors
  • MEMS and NEMS
  • Remote Sensors and Telemetry
  • Sensor Applications


Sensor Instrumentation and Measuring Technology

  • Metrology and Measurement Science
  • Methods of Measurements
  • Calibrations and Standards
  • Measurement of Electrical Quantities
  • Time and Frequency Measurements
  • Measurement of Force, Mass, Torque, Inclination and Acceleration
  • Magnetic Measurements
  • Hardness Measurements
  • Measurement of Geometrical Quantities
  • Temperature and Thermal Measurements
  • Pressure and Vacuum Measurements
  • Vibration and Noise Measurement
  • Flow Measurements
  • Chemical Measurements
  • Quantum Measurements and Photonics
  • Acoustics and the Ultrasonic Measurements
  • Environmental Measurements
  • Power and Energy Measurements
  • Measurement of Human Functions
  • Measurements in Biology and Medicine
  • Mathematical Tools for Measurements
  • Optical and Radiation Measurements
  • Microwave Measurements
  • Virtual Instruments and Data Acquisition Systems
  • Software Measurements
  • Measurement Systems
  • Distributed Measurements
  • Analog-to-Digital Converters, Digital and Mixed Signal Processing
  • Waveform Analysis and Measurements
  • Scientific and Industrial Instrumentation
  • Cyber-Physical Systems and IoT
  • Experimental Mechanics
  • Measurement in Robotics
  • Metrology in Food and Nutrition
  • Intelligent and Computer Vision Instruments
  • Reliability of Instrument and Measurement Systems
  • Nanometrology
  • Technical Diagnostics and Testing
  • Nondestructive Testing
  • Education and Training in Measurement and Instrumentation


Contribution Types:

  • Keynote presentations
  • Industrial presentations
  • Regular papers
  • Posters


Special Sessions:


Authors are welcome to manage special sessions during the conference. Each session will contain 4-6 papers in a related field as specified above


Session organizers will get:


- Certificate of Appreciation
- Registration discounts
- Special Publishing Theme within Conference Proceedings




Deadlines





Amsterdam, the netherlands



Committee





Chairmen


Prof., Dr. Sergey Y. Yurish (IFSA, Spain)

Dr. Amin Daneshmand Malayeri (Asia-SAME, UAE)


Advisory Chairmen


Prof. Gennaro Conte (University Roma Tre, Italy)

Dr. Pavel Shuk (Emerson Process Management, USA)

Dr. Marius Gheorghe (Ideal Aerosmith, Inc., USA)

Dr. Paolo Dabove (Politecnico di Torino, Italy)


Conference and Publication Manager


Tetyana Zakharchenko (IFSA Publishing, S.L., Spain)


International Program Committee Members and Reviewers:

(see more)






REGISTRATION FORM:





Please pay the registration fee at the first (above). Please fill-in ALL fields in the following form:​